In Vickers hardness testing, a force is applied uniformly and without impact to a specimen with a diamond indenter. The Vickers diamond creates an indentation in the shape of a pyramid with a square base, with an indentation depth of approximately 1/7 the length of the diagonal. The force applied through the indenter is maintained for approximately 10 to 15 seconds, followed by complete unloading. The two indentation diagonals are measured and then averaged. The Vickers hardness (HV) is calculated using a formula.

Technical specifications

• Manufacturer: KB Prüftechnik GmbH
• Max. test piece weight: 120kg
• Projection: 170 mm
• Test space height without cross table: 245 mm
• Test space height with cross table: 170 mm
• Battery LED illumination > 10 years
• Magnification zoom: 1:7 in 10 steps
• Resolution Z-axis: 0,005 µm
• Weight without stage: 61kg
• Weight with stage: 71kg
• Cross table travel: 180x160 mm

Applications

• Fast and precise measurement of individual indentations using autofocus and automatic analysis
• Measurements in the load range between macro, small load or micro hardness 0.005kg - 62.5kg
• Hardness mapping and trajectories on large specimens and workpieces, using the automated cross table and overview camera

Technical specifications

• Company: TESCAN GmbH
• Model: MIRA3

Magnifications from 2x to 1.000.000x

• The choice of different imaging detectors allows a high resolution characterization of the microstructure.
• Detectors in the contrast types secondary electrons (SE) or backscatter electrons (BSE) can be used.
• Special raster techniques allow panoramic images with low magnifications and high depth of field up to highest resolution investigations of the microstructure in the nm range.
• In addition, high-resolution overview images can be acquired using a "stage rasterization" technique, in which the sample stage moves automatically and combines many individual images into one image at the highest magnification.

Field Emission Cathode

• For highest resolution scanning electron beam microscopy in the sub-µm range, combined with reliable chemical and crystallographic electron beam microanalysis by EDX, WDX or EBSD, a modern field emission gun Fe is used.
• Accelerating voltage Ua = 200 V - 30 kV
• Beam current IB = 2 pA - 200 nA
• Vacuum p = < 9x10-3 Pa

High current mode

• The field emission cathode can be operated in high current mode, reaching a beam current of the order of modern microprobes
• High beam current of up to 200 nA.
• This enables the combination of the advantages of a high-resolution SEM and a highly sensitive microprobe with low-noise and reliable electron beam microanalysis while maintaining the high resolution and small beam diameters typical for the field emmision cathode

Large sample chamber GM 340x320x310mm

• High resolution scanning electron microscopy on smallest structures up to larger components, demonstrators or damage cases

Integrated plasma cleaner and liquid nitrogen cooled (-196 C°) cold trap

• In-situ plasma cleaning of samples and sample chamber
• Minimization of carbon contamination and other atmospheric contaminants

Applications

• Fast and precise measurement of individual indentations using autofocus and automatic evaluation.  
• Measurements in the load range between macro, small load or micro hardness 0.005kg - 62.5kg.
• Hardness mapping and trajectories on large specimens and workpieces, using the automated cross table and overview camera.

Funded by the Federal Ministry of Education and Research (BMBF)

This reflected-light microscope is used to perform and document microstructural analysis, microsection control, or cleanliness evaluations. The calibration of a camera, the different adjustable magnification options, give the operator the possibility to insert accurate measurement bars into the images. The instrument is also equipped with a polarization filter to detect any unevenness on the specimen surface. These can then be compensated for by the multifocus integrated in the software.

Technical specifications

• Magnification levels: 50x / 100x / 200x / 500x / 1000x
• Magnification gain of the tube: 1x / 1.25x /1.5x /2x
• Camera: 4.9MP
• DIC contrast adjustable
• Function for multifocus integrated

Applications

• Examination of ground sections
• Creation of specimen images
• Determination of the size of individual specimen components
• Verification of the preparation process
• Compensation for poor plane parallelism

The Leica M80 stereomicroscope is used to examine and document larger and unprepared specimens. With interchangeable objectives, as well as freely adjustable zoom and exposure levels, the microscope offers a wide range for macro and micro images. By calibrating a camera to the various adjustable magnification levels, it is possible to introduce a dimension bar with measurement accuracy into the images.

Technical specifications

• Magnification levels: 3.8x-70x adjustable in 20 steps
• Camera: 4.9MP
• Light intensity adjustable in steps
• Light module for different illumination angles available

Applications

• Examination of larger components and damaged areas
• Examination of larger sections
• Creation of macro images
• Dimensioning of components

Specimens can be examined and imaged with an extremely high resolution on the DM6 M light microscope from Leica. The parameters set during an exposure can be saved and reloaded for later exposures. In addition to the features of the other light microscopes, the Leica can scan a larger sample area and automatically stitch it together to generate a high-resolution overview image. With full automation of the operating parameters, the microscope can also be controlled remotely, allowing specimens to be viewed via live transmission.

Technical specifications

• Magnification levels: 25x / 50x / 100x / 200x / 500x / 1000x
• Operation: Analog and Digital
• Camera: 4.9MP
• Remote capable
• Panoramic images can be created
• Output of parameter histogram
• Function for multifocus integrated
• DIC contrast adjustable

Applications

• Examination of ground sections
• Creation of specimen images
• Determination of the size of individual specimen components
• Verification of the preparation process
• Compensation for poor plane parallelism
• Reproduction of image parameters
• Live connection through remote function

The Isomet 5000 enables millimeter-precise cutting of filigree specimens. Various fine cutting wheels and cutting parameters can be selected for different toughnesses. The constant flow of cooling water ensured by a pump system, as well as the automatic adjustment of the feed speed in case of too high strengths, ensure the lowest possible influence on the specimen material.

Technical specifications

• Disc speed: 1000-5000 rpm
• Coolant systems: Integrated recirculating cooling system
• Fine cutting wheels: Corundum / CBN / Diamond
• Cutting wheels Ø: 150mm
• Feed speed: 1,2-12,5 mm/min
• Automatic adjustment of the feed speed by Smart Cut

Applications

• Precision cutting on fine specimen material
• Cutting of soft to very hard materials

Both Vickers and Brinell hardness can be determined on Wolpert hardness testers. The indenter, consisting of a hard metal ball or diamond pyramid, penetrates the surface of a plane-parallel specimen without impact and creates an indentation in the material. The indentation is then projected onto a ground-glass screen integrated in the device, from where it can be measured and evaluated with the aid of an enclosed scale. The Brinell indenter is particularly suitable for softer materials, and the Vickers indenter for harder materials.

Technical specifications

• Measurement method: Vickers and Brinell
• Test load (Vickers): 1 / 5 / 10 / 30
• Stress level (Brinell): 1 / 2.5 / 5 / 10 / 15 / 30

Applications

• Hardness measurements in the macro, micro range
• Hardness measurements on soft and hard materials

In order to ensure a plane-parallel and scratch-free specimen surface, two Phoenix 4000 semi-automatic polishing machines are used. By means of an exchangeable specimen holder, up to 6 embedded specimens can be ground and polished simultaneously. During the grinding and polishing process, parameters such as contact pressure, direction of rotation, rotation speed and polishing time can be adapted to the individual specimen material.

Technical specifications

• max. rotational speed: 600 rpm
• max. contact pressure: 5 bar
• pressure options: Centrally or individually controlled
• specimen grips: Ø 20 mm / Ø 30 mm / Ø 40 mm / Ø 50 mm

Applications

• Surface grinding of specimen material
• Grinding and polishing of sections

Up to two embeddings can be performed simultaneously in a short time on the Opal 460 hot embedding presses. The sample to be embedded is placed on one of the plungers and encapsulated in an added plastic granulate during the process. Parameters such as pressure, holding time, or temperature can be freely adjusted to the desired embedding material. The embedding process significantly simplifies the handling of more complex specimen geometries for further preparation. By using a conductive mounting medium, the specimens can be easily examined under a scanning electron microscope after preparation.

Technical specifications

• Pressing shape: Ø 50 mm / Ø 60 mm / Ø 70 mm
• Closure system: sliding closure
• Temperature range: 20-200°C
• Holding time: adjustable
• Cooling time: adjustable
• Max. pressure in the die depending on die size: 310 bar
• Heating power: 4x 630 W

Applications

• Embedding of specimen material
  Preparation for REM view